<1Ppm Device to Chip Level Reliability Characterization for High-Density DDR5 DRAMs

N-H Lee,S. Lee,G J. Kim, Y J. Kim,B W. Woo, Y,H K. Kim, E J. Kim,Y S. Lee,Y C Hwang, S B. Ko,S. Pae

2023 International Electron Devices Meeting (IEDM)（2023）

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关键词

Reliable Characterization,Chip Level,Statistical Distribution,High Acceleration,Gate Oxide,Optimization Process,Bit Error,Forward Error Correction,Block Level,Lower Percentile,Lower Failure Rate

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