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Beam Diagnostics with Silicon Pixel Detector Array at PADME Experiment

S. Bertelli,F. BossiP. Valente,A. Variola

Journal of Instrumentation(2024)SCI 4区

INFN LNF | Sofia Univ | Princeton Univ | INFN Sez Roma | DESY | Edingburgh Univ | Sapienza Univ

Cited 0|Views12
Abstract
During 2022 data taking (Run III) PADME searched for a resonant production and a visible decay of the X17 particle into e(+)e(-). A precise knowledge within 1% uncertainty of the number of positrons was required for the observation. To that purpose, an array of 2 x 6 Timepix3 (total of 512 x 1536 pixels) hybrid pixel detectors operated in data-streaming mode with ToA resolution of 1.56 ns for every pixel was employed. Two methods for data acquisition were developed. A frame-based method, integrating the number of hits for each individual pixel for a predefined period of time served for monitoring the beam conditions and to provide a rough estimation of the beam distribution and number of positrons. A data streaming mode exploiting the nanosecond time resolution of Timepix3 detector was used for precise characterization of the transverse beam profile and the distribution of the incident positrons within each bunch of similar to 200 ns duration.
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Key words
Beam-line instrumentation (beam position and profile monitors,beam-intensity monitors,bunch length monitors),Particle tracking detectors,Analysis and statistical methods,Data processing methods
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要点】:本文介绍了在PADME实验中,利用Timepix3硅像素探测器阵列进行束诊断,实现了对正电子数量的精确测量,以满足观测X17粒子所需的1%不确定性要求。

方法】:采用2 x 6 Timepix3硅像素探测器阵列,以数据流模式运行,每个像素具有1.56 ns的时间分辨率。

实验】:实验使用了两种数据采集方法,一种基于帧的集成方法用于监测束条件和提供束分布及正电子数量的粗略估计;另一种数据流模式利用Timepix3探测器纳秒级时间分辨率,精确表征了横向束轮廓和每个约200 ns持续时间的束团内正电子分布。数据集名称未提及,但实验结果用于观测X17粒子的产生和衰变。