SSRESF: Sensitivity-aware Single-particle Radiation Effects Simulation Framework in SoC Platforms Based on SVM Algorithm
Design Automation Conference（2024）
关键词
System-on-a-Chip Test,Soft Errors,Single Event Upsets
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要