Defect Engineering in Multilayer H-Bn Based RRAM by Localized Helium Ion Irradiation
IEEE Electron Device Letters（2024）
Key words
Helium,Ions,Voltage,Electrodes,Switches,Resistance,Nonvolatile memory,Non-volatile memory,RRAM,hexagonal boron nitride,helium ion beam implantation,conductive filament
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