Characterization of the Low Electric Field and Zero-Temperature Two-Level-system Loss in Hydrogenated Amorphous SiliconFabien Defrance,Andrew D. Beyer,Shibo Shu,Jack Sayers,Sunil R. GolwalaPhysical Review Materials（2024）引用 2|浏览18AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
