PCH-EM: A Solution to Information Loss in the Photon Transfer Method
IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）
关键词
Noise,Photonics,Electrons,Uncertainty,Histograms,Data models,Semiconductor device modeling,Conversion gain,deep subelectron read noise (DSERN),expectation-maximization (EM) algorithm,PCH,photon counting,photon counting histogram EM (PCH-EM),photon transfer (PT),QIS,quanta exposure,read noise
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