Cross-Stimulus Transfer Method Using Common Impulse Response for Fast Calibration of SSVEP-Based BCIs
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT（2024）
关键词
Feature extraction,Electroencephalography,Calibration,Brain modeling,Visualization,Training,Frequency modulation,Brain-computer interfaces (BCIs),common model parameters,cross-stimulus transfer,steady-state visual evoked potential (SSVEP),transfer learning
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