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Reliability Analysis of Random Telegraph Noisebased True Random Number Generators

Tommaso Zanotti,Alok Ranjan,Sean J. O’Shea,Nagarajan Raghavan,Ramesh Thamankar,Kin Leong Pey,Francesco Maria Puglisi

2023 IEEE International Integrated Reliability Workshop (IIRW)（2023）

Cited 1|Views16
Key words
Random Telegraph Noise (RTN),True Random Number Generator (TRNG),RTN instability,Circuit reliability,Gate dielectrics.
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