The Origin of Memory Window Closure with Bipolar Stress Cycling in Silicon Ferroelectric Field-Effect-transistorsMatthias Passlack,Nujhat Tasneem,Chinsung Park,Prasanna Venkat Ravindran,Hang Chen,Dipjyoti Das,Shimeng Yu,Edward Chen,Jer-Fu Wang,Chih-Sheng Chang, Yu-Ming Lin,Iuliana Radu,Asif KhanJournal of Applied Physics（2024）引用 1|浏览22AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
