谷歌浏览器插件
订阅小程序
在清言上使用

Significant Reduction in Sidewall Damage Related External Quantum Efficiency (EQE) Drop in Red InGaN Microleds (∼625 Nm at 1 A Cm-2) with Device Sizes Down to 3 Μm

JAPANESE JOURNAL OF APPLIED PHYSICS(2024)

引用 1|浏览14
关键词
light emitting diodes,surface recombination,external quantum efficiency,MicroLEDs,red microLED
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要