Effect Due to Cs Injection Upon Current Oscillation of the Beam Extracted from the J-PARC Negative Hydrogen Ion Source
JOURNAL OF INSTRUMENTATION（2024）
Key words
Ion sources (positive ions,negative ions,electron cyclotron resonance (ECR),electron beam (EBIS)),Beam dynamics,Beam-line instrumentation (beam position and profile monitors,beam-intensity monitors,bunch length monitors)
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