Research on Test Parameters of Ultra High Resolution CMOS Image Sensor Microsystems

Yu Tian,Pei Liu,Erming Rui,Qiang Jiao, Yuanyuan Xiong, Yanlei Dong, Yue Ma, Junlin Li

2023 2nd International Conference on Automation, Robotics and Computer Engineering (ICARCE)（2023）

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关键词

Ultra high resolution,CMOS image sensor microsystem,test parameter,geometric parameters,multi-objective identification of complex scenes

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