Methodologies for Implementation of Standard-Cell Libraries for Radiation Hardened Environments
15TH IEEE LATIN AMERICAN SYMPOSIUM ON CIRCUITS AND SYSTEMS, LASCAS 2024（2024）
Key words
VLSI,radiation,radiation hardening,CMOS,SoC,system on a chip,total ionizing dose,TID,single event upsets,annular gates,diffusion rings,space,nuclear,standard cell kit,triple modular redundancy flip flop
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