Novel Outlier-Robust Accelerated Degradation Testing Model and Lifetime Analysis Method Considering Time-Stress-Dependent Factors
IEEE Transactions on Industrial Informatics（2024）
关键词
t-distribution,accelerated degradationtesting (ADT),first hitting time (FHT),lifetime analysis,Metropolis-Hastings (M-H) method,time-dependent factors,Wiener process
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