Nanoscale Visualization of High-Angle Misorientations in Quartz-Rich Rocks Using SEM-EBSD and Atomic Force Microscopy
JOURNAL OF STRUCTURAL GEOLOGY（2024）
Key words
Electron backscatter diffraction (EBSD),Atomic Force microscopy (AFM),misorientation,chemical mechanical polishing (CMP),random high angle grain boundary (RHAGB),Dauphine <acute accent> twin boundary (DTB)
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