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Nanoscale Speckle Patterning for Combined High‐resolution Strain and Orientation Mapping of Environmentally Sensitive Materials

Benjamin Poole, Alex Marsh,David Lunt,Chris Hardie, Mike Gorley, Cory Hamelin,Allan Harte

STRAIN(2024)

Cited 2|Views10
Key words
digital image correlation,electron backscatter diffraction,micromechanics,scanning electron microscopy,speckle pattern
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