Easy over Hard: A Simple Baseline for Test Failures Causes Prediction
COMPANION PROCEEDINGS OF THE 32ND ACM INTERNATIONAL CONFERENCE ON THE FOUNDATIONS OF SOFTWARE ENGINEERING, FSE COMPANION 2024（2024）
关键词
Log Analysis,Test Failure Causes,Test Logs,Root Causes Analysis
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要