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Material Removal and Tool Path Ripple Error of Bonnet Polishing Using Pads with Different Groove Patterns

Hsuan-Chun Chen, Jyun-Ting Lin,Yu-Hsiang Lo,Chun-Wei Liu

The International Journal of Advanced Manufacturing Technology(2024)

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Key words
Bonnet polishing,Polishing pad,Tool path ripple (TPR),Tool influence function (TIF)
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