Use of DC Probes for Multi-MHz Measurements of Crosstalk and Substrate Coupling in Gallium Nitride Power Integrated Circuits
2024 IEEE 36TH INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, ICMTS 2024（2024）
关键词
Dc Probes,Power Integrated Circuits,Spectroscopy,Electrical Measurements,Signal-to-noise,Fundamental Frequency,Signal Propagation,Power Level,Signal Loss,Measurement Setup,Device Structure,Voltage Signal,Electrical Contact,Vector Network Analyzer,Voltage Amplitude,Systemic Loss,Digital Oscilloscope,Signal Path,Signal Waveform,Coaxial Cable,Physical Layout,Interference Sources,Frequency F0
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