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Comprehensive Performance and Reliability Assessment of Se-based Selector-Only Memory

Taras Ravsher,Robin Degraeve,Daniele Garbin,Sergiu Clima,Andrea Fantini,Gabriele Donadio,Shreya Kundu,Wouter Devulder,Hubert Hody,Goedele Potoms,Jan Van Houdt,Valeri Afanas'ev,Attilio Belmonte,Gouri Kar

2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024（2024）

Cited 3|Views26
Key words
amorphous chalcogenides,cross-point arrays,ovonic threshold switches (OTS),polarity effect,self-selective memories
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