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Enhancing Ferroelectric Characterization at Nanoscale: A Comprehensive Approach for Data Processing in Spectroscopic Piezoresponse Force Microscopy

H. Valloire, P. Quemere,N. Vaxelaire, H. Kuentz,G. Le Rhun,L. Borowik

Journal of Applied Physics（2024）

Cited 1|Views5

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