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Vmin Testing under Variations: Defect Vs. Fault Coverage

Hanieh Jafarzadeh,Florian Klemme,Hussam Amrouch,Sybille Hellebrand,Hans-Joachim Wunderlich

Latin American Test Symposium（2024）

Cited 0|Views12
Key words
Small Delay Faults,Low Voltage Testing,Vmin Testing under Variations
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