A Novel Measurement Method for SiPM External Crosstalk Probability at Low Temperature
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）
Key words
External crosstalk (eCT),low temperature,photon detection efficiency (PDE),silicon photomultiplier (SiPM),External crosstalk (eCT),low temperature,photon detection efficiency (PDE),silicon photomultiplier (SiPM)
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