Properties of Z1 and Z2 Deep-Level Defects in N-Type Epitaxial and High-Purity Semi-Insulating 4H-SicPawel Kaminski,Roman Kozlowski,Jaroslaw Zelazko,Kinga Kosciewicz,Tymoteusz CiukCrystals（2024）引用 1|浏览2关键词4H-SiC,Z(1) and Z(2) defects,negative-U properties,LDLTS,LPITSAI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
