In-Field Detection of Small Delay Defects and Runtime Degradation Using On-Chip Sensors
2024 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION, DATE（2024）
关键词
On-chip Sensors,Delay Line,Temperature Fluctuations,High-performance Computing,Functional Failure,Voltage Fluctuations,Time-to-digital Converter,Amount Of Delay
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