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Fringing Analysis and Forward Modeling of Keck Planet Imager and Characterizer (KPIC) Spectra

GROUND-BASED AND AIRBORNE INSTRUMENTATION FOR ASTRONOMY X(2024)

CALTECH | Univ Calif San Diego | Ohio State Univ | Univ Calif Los Angeles | Royal Observ | WM Keck Observ | Univ Calif Santa Cruz | Pomona Coll

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Abstract
The Keck Planet Imager and Characterizer (KPIC) combines high contrast imaging with high resolution spectroscopy (R similar to 35,000 in K band) to study directly imaged exoplanets and brown dwarfs in unprecedented detail. KPIC aims to spectrally characterize substellar companions through measurements of planetary radial velocities, spins, and atmospheric composition. Currently, the dominant source of systematic noise for KPIC is fringing, or oscillations in the spectrum as a function of wavelength. The fringing signal can dominate residuals by up to 10% of the continuum for high S/N exposures, preventing accurate wavelength calibration, retrieval of atmospheric parameters, and detection of planets with flux ratios less than 1% of the host star. To combat contamination from fringing, we first identify its three unique sources and adopt a physically informed model of Fabry-P ' erot cavities to apply to post-processed data. We find this strategy can effectively model the fringing in observations of bright stars, reducing the residual systematics caused by fringing by a factor of 2. Next, we wedge two of the transmissive optics internal to KPIC to eliminate two sources of fringing and confirm the third source as the entrance window to the spectrograph. Finally, we apply our previous model of the Fabry-P ' erot cavity to new data taken with the wedged optics to reduce the amplitude of the residuals by a factor of 10.
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exoplanets,instrumentation,high contrast imaging,high resolution spectroscopy,Keck telescope,fringing
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要点】:本文针对Keck Planet Imager and Characterizer (KPIC)光谱中的杂散光振荡(fringing)问题,提出了一种基于物理模型的校正方法,有效降低了系统噪声,提高了测量精度。

方法】:作者首先识别出导致fringing的三种独特来源,并采用基于物理信息的Fabry-Perot腔模型对后处理数据应用校正。

实验】:通过在KPIC内部两个透射光学元件上施加楔形处理,消除了两种fringing来源,并确认第三种来源为光谱仪的入口窗口。使用楔形光学元件后的新数据,应用Fabry-Perot腔模型,将残差幅度降低了10倍。数据集名称未在摘要中提及。