Solid‐Solution Limits and Thorough Characterization of Bulk Β‐(alxga1‐x)2o Single Crystals Grown by the Czochralski Method
Zbigniew Galazka,Andreas Fiedler,Andreas Popp,Palvan Seyidov,Saud Bin Anooz,Roberts Blukis,Jana Rehm,Kornelius Tetzner,Mike Pietsch,Andrea Dittmar,Steffen Ganschow,Arub Akhtar,Thilo Remmele,Martin Albrecht,Tobias Schulz,Ta-Shun Chou,Albert Kwasniewski,Manuela Suendermann, Thomas Schroeder,Matthias Bickermann Advanced Materials Interfaces（2025）
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Czochralski method,doping,physical properties,wafers
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