Degradation Monitoring Through Software-controlled On-chip Sensors for RISC-V
IEEE EUROPEAN TEST SYMPOSIUM, ETS 2024（2024）
Key words
On-chip Sensors,Field Test,Functional Failure,Software Defect,Critical Path,Transient Fluctuations,Manufacturing Defects,Regression Model,Root Mean Square Error,Parametric Tests,Sensor Data,Failure Cases,Sensor Measurements,Mean Absolute Percentage Error,Test Pattern,Transient Behavior,Input Patterns,Delay Line,Most Significant Bit,Voltage Fluctuations,Time-to-digital Converter,Calibration Values,Amount Of Delay,Monitoring Platform,Sensor Values,Low Supply Voltage,Voltage Sag,Reference Model
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