Single-Event Burnout Effects of Complementary LDMOS Devices in High-Voltage Integrated Circuits
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY（2024）
关键词
Electric fields,Ions,Transistors,Junctions,High-voltage techniques,Electrodes,Charge carrier processes,High-voltage integrated circuits (HVIC),lateral diffused metal-oxide-semiconductor (LDMOS),single-event burnout (SEB)
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要