Temperature-Dependent Noise Performance of Single-Photon Avalanche Diodes and Active Quenching Circuits in 180-Nm HV CMOS
International Convention on Information and Communication Technology, Electronics and Microelectronics（2024）
关键词
single photon avalanche diode (SPAD),active quenching circuit (AQC),dark count rate (DCR),afterpulsing,photodetectors,CMOS image sensors,photon counting
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