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Experimental Study on Damage Effect of Mid-Infrared Pulsed Laser on Charge Coupled Device (CCD) and HgCgTe Detectors

Yang Liu, Feng Zhou,Yunzhe Wang,Yin Zhang,Yunfeng Zhang,Hanyu Zheng,Junfeng Shao

Sensors（2024）

Cited 1|Views9
Key words
mid-infrared pulsed laser,CCD detector,HgCdTe detector,damage threshold,out-band
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