Gate Breakdown Induced Stuck Bits in Sub-20 Nm FinFET SRAMQian Sun,Yaqing Chi,Yang Guo,Bin Liang,Ming Tao,Zhenyu Wu,Hongxia Guo,Qiwen Zheng,Wangyong Chen, Yulin Gao,Peixiong Zhao,Xingji Li,Jianjun Chen,Deng Luo,Hanhan Sun,Yahao FangApplied Physics Letters（2024）引用 0|浏览6AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
