Reduced Trap State Density in AlGaN/GaN HEMTs with Low-Temperature CVD-grown BN Gate DielectricZiyi He,Xiang Zhang,Tymofii S. Pieshkov, Ali Ebadi Yekta,Tanguy Terlier,Dinusha Herath Mudiyanselage,Dawei Wang,Bingcheng Da,Mingfei Xu,Shisong Luo,Cheng Chang,Tao Li,Robert J. Nemanich,Yuji Zhao,Pulickel M. Ajayan,Houqiang FuApplied Physics Letters（2024）引用 2|浏览7AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
