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Unsupervised Deep Denoising for Four-Dimensional Scanning Transmission Electron Microscopy

Microscopy and Microanalysis(2024)

Monash Univ

Cited 0|Views1
Abstract
By simultaneously achieving high spatial and angular sampling resolution, four dimensional scanning transmission electron microscopy (4D STEM) is enabling analysis techniques that provide great insight into the atomic structure of materials. Applying these techniques to scientifically and technologically significant beam-sensitive materials remains challenging because the low doses needed to minimise beam damage lead to noisy data. We demonstrate an unsupervised deep learning model that leverages the continuity and coupling between the probe position and the electron scattering distribution to denoise 4D STEM data. By restricting the network complexity it can learn the geometric flow present but not the noise. Through experimental and simulated case studies, we demonstrate that denoising as a preprocessing step enables 4D STEM analysis techniques to succeed at lower doses, broadening the range of materials that can be studied using these powerful structure characterization techniques.
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要点】:本文提出了一种无监督深度学习模型,用于对四维扫描透射电子显微镜(4D STEM)数据进行降噪,提高了低剂量条件下材料的原子结构分析能力。

方法】:通过利用探针位置与电子散射分布之间的连续性和耦合性,模型能够学习数据的几何流动而非噪声,从而实现降噪。

实验】:通过实验和模拟案例研究,证明了降噪作为预处理步骤,使得4D STEM分析技术在较低剂量下也能成功应用,扩展了可用这些强大结构表征技术研究的材料范围。数据集未具体提及。