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A Low-Cost Quadruple-Node-Upsets Resilient Latch Design

IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS(2024)

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Key words
Latches,Delays,Transistors,Resilience,Power demand,Inverters,Micromechanical devices,Low cost,quadruple-node upset (QNU),radiation hardening,reliability,resilience latch
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