Self-Adapting Power Density Sampling for On-Chip Thermal Prediction with Transistor Level Granularity
IEEE Transactions on Components Packaging and Manufacturing Technology（2024）
关键词
Thermal analysis,Power system measurements,Land surface temperature,Density measurement,Temperature distribution,Layout,Packaging,Critical temperature information (critical T info.),fine-grained,power density map (PDM),power density sampling,thermal prediction
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