Characterization of Composition Dependence of Properties of a MgNiO-based MSM Structure

Umit Dogan,Fahrettin Sarcan, Elanur Hut,Barat Achinuq,Ahmad Althumali, Ibrahim Aldawood,Adam Kerrigan,Vlado K. Lazarov,Ayse Erol

Physica Scripta（2024）

Istanbul Univ

Cited 0|Views4

Abstract

In this study, the effect of Mg composition on structural and optical properties of MgxNi1-xO alloy thin film single crystal semiconductors as well as their implementation into Metal-Semiconductor-Metal (MSM) photodetector are studied. An 850 meV blue-shift of the bandgap is observed from 3.65 eV to 4.50 eV with increasing Mg composition from 0% to 67%. The deep ultraviolet/visible rejection ratio, which is the ratio of photosensitivity at a peak wavelength of 360 nm to that at 450 nm is found to be similar to 58 for Mg composition of 67%. Mg rich (%67 Mg) alloy-based photodetector is found to have two orders smaller dark current and have higher spectral response compared to NiO-based one. Spectral responsivities for MgxNi1-xO photodetectors are determined as 415 mA W-1, 80 mA W-1, and 5.6 mA W-1 for Mg compositions of 67%, 21%, and 0% (reference-NiO), respectively. Furthermore, the detectivity of the photodetectors enhances as Mg composition increases and the highest detectivity of a magnitude of similar to 1011 Jones is found for the photodetector with Mg composition of 67%.

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Key words

MSM,photodetector,MgNiO,metal-semiconductor-metal,UV,MBE,photoconductivity

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