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Extremely Scaled Perpendicular SOT-MRAM Array Integration on 300mm Wafer

Farrukh Yasin, A. Palomino, A. Kumar, V. Pica,Simon Van Beek,Giacomo Talmelli,V. D. Nguyen,Stefan Cosemans,D. Crotti,Kurt Wostyn,Gouri Sankar Kar,Sebastien Couet

Symposium on VLSI Technology（2024）

Cited 0|Views9
Key words
Extreme Scale,Pulse Width,Free Layer,Least Significant Bit,Track Width,Dual Layer
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