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Wobulation in Structured Illumination Microscopy Using a Tunable Electrowetting Prism

2024 Conference on Lasers and Electro-Optics (CLEO)(2024)

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Structured Illumination,Structured Illumination Microscopy,Optical Sections,Electrode,Image Contrast,Epifluorescence,Image Plane,Excitation Source,Single Pattern,Sample Plane,Tube Lens,Spatial Phase,Digital Micromirror Device,Microlens Array
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