Machine Learning for Microscopy Data Analysis: Toward Real-time Optical and Electrical Characterization of Sub-micron Materials
Amitrajit Mukherjee,Robby Reynaerts,Bapi Pradhan,Sudipta Seth,Andreas T. Rösch,Tamali Banerjee,Lata Chouhan,Handong Jin,Christian Sternemann,Michael Paulus,Luca Leoncino,Kunal S. Mali,Steven De Feyter,Maarten Roeffaers, Egbert Willem Meijer,Johan Hofkens,Elke Debroye crossref（2024）
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