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Propagation and Masking Characteristics of Errors During Software Testing in Synchronous Programming

Young-Mi Kim,Jin-Young Choi, Seunghoon Yoo,Myunghwan Park

IEEE ACCESS(2024)

Cited 0|Views2
Key words
Software,Testing,Measurement uncertainty,Programming,Monitoring,Software measurement,Computer languages,Software testing,Java,Sensitivity analysis,Error masking,error propagation,synchronous programming,Lustre language,mutant generation,test cases
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