FI-CDM and LICCDM Testing on Wafer, Single Die and Package Levels
2024 46TH ANNUAL EOS/ESD SYMPOSIUM, EOS/ESD 2024（2024）
关键词
Electrostatic Discharge,Waveform,Power-law,Pulse Width,Differentiation Capacity,Peak Current,Oscilloscope,Transmission Line,Ground Plane,Pulse Amplitude,Tektronix,Secondary Peak,Capacitive Coupling,Probe Station,Biggest Change,Test Voltage,Device Packaging
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