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Atomic Layer Deposited ZnO Negative Capacitance Thin-Film Transistors with Hf0.5Zr0.5O2-Based Ferroelectric Gates

IEEE ELECTRON DEVICE LETTERS(2024)

Cited 0|Views9
Key words
Thin film transistors,ZnO,ferroelectric gate,Hf0.5Zr0.5O2 (HZO)
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