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Research on the Evolution of Defects Initiation and the Diffusion of Dopant on the Si/SiO2 Interface

Yunqi Yang,Dongdong Chen,Di Li,Tianlong Zhao, Weida Zhang, Wen Qiao, Yingjie Liang,Yintang Yang

Advanced Materials Interfaces(2025)

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Key words
defects initiation,defect modeling,dopant diffusion,Si/SiO2 interface
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