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Enhanced Reliability of Cu-Sn Bonding Through the Microstructure Evolution of Nanotwinned Copper

Xinyu Jin, Huahan Li,Yingying Sun,Zhiqin Chen,Peixin Chen, Hongwei Su,Ming Li,Yunwen Wu

ACTA MATERIALIA(2025)

引用 1|浏览8
关键词
Nanotwinned Cu,Kirkendall voids,Diffusion behavior,Interfacial IMC growth kinetics
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