Beyond Total Locking: Demonstrating and Measuring Mutual Influence on a RO-Based True Random Number Generator on an FPGA
Annual IEEE International System-on-Chip Conference（2024）
Key words
True Random Number Generator,Ring oscillator,Locking phenomenon,Mutual influence,Kolmogorov-Smirnov test
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined