Study on the Single Event Burnout Mechanism of $\beta$ -Ga $_{\text{2}}$ O $_{\text{3}}$ Schottky Barrier Diode under Heavy Ion Irradiation
IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）
关键词
Ions,Radiation effects,Lattices,Electric fields,Scanning electron microscopy,Germanium,Schottky diodes,Impact ionization,Threshold voltage,Temperature measurement,(beta-Ga2O3) Schottky barrier diode (SBD),heavy ion irradiation,impact ionization,lattice temperature,single event burnout (SEB)
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