In-Situ Characterization Tools for Evaluating Radiation Tolerance and Elemental Migration in Perovskites

Mohin Sharma,Mritunjaya Parashar, Darshpreet Kaur Saini,Todd A. Byers, Charles Bowen,Megh N. Khanal,Vincent R. Whiteside,Ahmad R. Kirmani,Joseph M. Luther,Ian R. Sellers,Gary A. Glass,Bibhudutta Rout

2024 IEEE 52nd Photovoltaic Specialist Conference (PVSC)（2024）

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关键词

Radiation Tolerance,Irradiation,Effects Of Radiation,Radiation Exposure,Ion Beam,Perovskite Lattice,Rutherford Backscattering,Rutherford Backscattering Spectrometry,Beamline,Solar Cells,Photovoltaic,Negative Ion,Valence Band,Electrochemical Impedance Spectroscopy,Microprobe,Semiconductor Devices,Beam Current,Halide Perovskites,PIN Diodes,Charge Collection Efficiency

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