Direct Capture of Switching Mechanical Wave on IGBT Bare Dies
IEEE TRANSACTIONS ON POWER ELECTRONICS（2025）
Key words
Insulated gate bipolar transistors,Switches,Laser beams,Surface emitting lasers,Stress,Transient analysis,Accuracy,Sensors,Vibrations,Feature extraction,Insulated gate bipolar transistor (IGBT) bare dies,laser interferometric vibrometer,on-chip detection,switching mechanical wave
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