Unified Model for Trap-Limited Conduction Via Field-Driven Interactions and Poole–Frenkel Emission
IEEE TRANSACTIONS ON ELECTRON DEVICES（2025）
关键词
Electron traps,Electrons,Electric fields,Semiconductor device modeling,Radiative recombination,Mathematical models,Probabilistic logic,Space charge,Solid modeling,Steady-state,Excess carrier dynamics,field-driven emission,Poole-Frenkel (P-F) emission,Shockley-Read-Hall (SRH) framework,trap-limited space-charge-limited current (T-SCLC)
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